March 2010  – March 2013

PhD: theory of nanophotonics and nanoelectronics phenomena, University of Eexter, College of Engineering, Mathematics and Physical Sciences, UK. Thesis “Quantum Rings in Electromagnetic Fields”. Supervisor: Prof M. Portnoi.

September 2006 – June 2008

MSc: applied physics and engineering, St. Petersburg State Polytechnic University, Faculty of Physical Science and Technology, Russia. Master’s degree with distinction (GPA: 5.0/5.0). Thesis “Numerical simulation of the laser-produced plasma radiation”.

September 2002 – June 2006

BSc: applied physics and engineering, St. Petersburg State Polytechnic University, Faculty of Physical Science and Technology, Russia. Bachelor’s degree with distinction (GPA: 5.0/5.0). Thesis “Methods of crystal assembly in semiconductors fabrication”.


02/2017 – present time

WaveOptics / Snapchat (Augmented Reality displays), Abingdon, UK. Director of Nanophotonics Technology. Previous roles: Director of Waveguide Development, Senior Manager for Waveguide Development, Head of Research & Processes, Principle Waveguide Engineer. 

08/2020 – present time

UK Metamaterials Network (funded by EPSRC and KTN). Coordinator of the Industry Forum, Member of the Leadership Team.

04/2020 – present time

Centre for Metamaterials Research and Innovation, Exeter, UK. Member of the Board of Advisors.

01/2018 – 03/2021

University of Exeter, Nano-Engineering Science and Technology Group, Exeter, UK. Honorary Senior Research Fellow.

03/2010 – 01/2017

University of Exeter, College of Engineering, Mathematics and Physical Sciences, Exeter, UK. Research Fellow. Previous Roles: Associate Research Fellow, Early Stage Researcher. 

08/2008 – 02/2010

FORS Group (IT consultancy), Saint-Petersburg, Russia. Team Leader – Software Development.

09/2007 – 08/2008

KORUS Consulting (IT consultancy), Saint-Petersburg, Russia. System Analyst – Software Development. 

04/2006 – 05/2007

NWIRAM (management consultancy), Saint-Petersburg, Russia. Business Analyst – Process Engineering.  


Project Management

Experienced in managing complex projects and distributed teams. Familiar with various project management techniques including Waterfall, Agile, Scrum, Kanban, Scrumban.

Tools: JIRA, Confluence, MS Project, Asana, MS Visio, SharePoint, Communication tools i.e. Microsoft Teams, Slack

Design and Modelling

Sequential and Mote Carlo Ray Tracing, RCWA (Rigorous Coupled-Wave Analysis), FEM (Finite-Element Methid), FDTD (Finite-difference time-doma), Fortran, Python, SQL.

Tools: UNIGIT, MC Grating, COMSOL Multiphysics, Lumerical, Zeemax, Matlab, Maple, Mathematica, MEDUSA (plasma thermodynamics modelling), FLYCHK (modelling of plasmas emission), AutoCAD, SolidWorks.

Cleanroom Skills

Working in and managing class 10 and class 100 cleanrooms. Experienced in maintenance of state-of-the-art equipment, monitoring health & safety procedures in the lab to reduce risk hazards and establish safe working environment.

Materials Deposition

Chemical vapour deposition (CVD), physical vapour deposition (PVD), e-beam evaporation and thermal annealing of thin films.

Tools: Moorfield nanoCVD-8G, Moorfield nanoPVD, Nordiko (magnetron sputtering).


E-beam Plasma and low-power RIE plasma based chemical modification of materials using Fluorine, Chlorine and Oxygen functional species.

Tools: JLS Designs RIE 80 Etching system, Moorfield Nano RTCH

Device Fabrication

Micro and Nanofabrication optical lithography, laser lithography, e-beam lithography, and nanoimprint lithography techniques. Device processing using plasma etching (RIE, ICP, IBE), wet-chemical etching, rapid thermal annealing (RTA).

Tools: EVG Nanoimprint Instruments, NanoBeam NB4 Electron Beam Lithography System, Durham Magneto Optics Laser Writer, HHV Auto 306 Thermal Evaporator, JLS Designs RIE 80 Etching System, LoadPoint Micro Ace 3 Dicing Saw, Oxford Instruments systems.


Materials and device characterization using atomic force microscopy (AFM), scanning-electron microscopy (SEM), focused ion beam (FIB) milling, energy-dispersive X-ray spectroscopy (EDX), X-ray diffraction (XRD), FTIR spectrometry, Raman spectroscopy, ellipsometry.

Tools: Renishaw RM1000 Raman system, Horiba Xplora Raman system, FEI SEM – FIB Dualbeam System, Oxford Instruments EDX, Keithley Source Meters (transport measurements), AIST SPM (AFM system), KLA-Tencor D-100 Surface Profiler, Zygo optical profilers.